A method to determine γ branching ratios using charged particle detectors for states in 18O
Author(s) -
S. Pirrie,
Tz. Kokalova,
C. Wheldon,
S. Bailey,
J. Bishop,
N. Curtis,
R. Smith,
D. Torresi,
A. Turner,
R. Hertenberger,
H.-F. Wirth,
T. Faestermann,
D. Mengoni,
D. Dell’Aquila
Publication year - 2018
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5078856
Subject(s) - spectrograph , branching (polymer chemistry) , detector , charged particle , silicon , nuclear physics , resolution (logic) , physics , branching fraction , particle (ecology) , materials science , computational physics , optics , ion , optoelectronics , spectral line , computer science , oceanography , quantum mechanics , astronomy , artificial intelligence , composite material , geology
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