Open AccessCorrelative microscopy combining transmission electron microscopy and secondary ion mass spectrometry: A general review on the state-of-the-art, recent developments, and prospects
Author(s) -
Santhana Eswara,
Alisa Pshenova,
Lluís Yedra,
Hung Quang Hoang,
Jelena Lovrić,
Patrick Philipp,
Tom Wirtz
Publication year - 2019
Publication title -
applied physics reviews
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.084
H-Index - 66
ISSN - 1931-9401
DOI - 10.1063/1.5064768
Subject(s) - secondary ion mass spectrometry , characterization (materials science) , correlative , transmission electron microscopy , in situ , mass spectrometry , resolution (logic) , nanotechnology , microscopy , materials science , analytical chemistry (journal) , chemistry , computer science , optics , physics , artificial intelligence , chromatography , linguistics , philosophy , organic chemistry
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