Resolving ZnO-based coaxial core-multishell heterostructure by electrical scanning probe microscopy | Zendy

Lin Wang | Zendy; Corinne Sartel | Zendy; Saïd Hassani | Zendy; V. Sallet | Zendy; G. Brémond | Zendy

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Resolving ZnO-based coaxial core-multishell heterostructure by electrical scanning probe microscopy

Author(s) -

Lin Wang,

Corinne Sartel,

Saïd Hassani,

V. Sallet,

G. Brémond

Publication year - 2018

Publication title -

applied physics letters

Language(s) - Uncategorized

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.5054685

Subject(s) - materials science , heterojunction , spreading resistance profiling , scanning capacitance microscopy , optoelectronics , chemical vapor deposition , nanowire , scanning electron microscope , microscopy , scanning probe microscopy , electrical resistivity and conductivity , coaxial , nanotechnology , chemical mechanical planarization , optical microscope , layer (electronics) , silicon , optics , composite material , scanning confocal electron microscopy , physics , electrical engineering , engineering

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