Open AccessResidual gas effect in LEBT on transverse emittance of multiply charged heavy ion beams extracted from ECR ion source
Author(s) -
T. Nagatomo,
Vasilis Tzoganis,
J. P. Mira,
T. Nakagawa,
O. Kamigaito
Publication year - 2018
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5053359
Subject(s) - thermal emittance , ion source , argon , atomic physics , space charge , chemistry , beam (structure) , helium , analytical chemistry (journal) , ion , ion beam , materials science , optics , physics , electron , nuclear physics , organic chemistry , chromatography
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