Extraction of many H− beamlets from ion source NIO1
Author(s) -
M. Cavenago,
G. Serianni,
P. Veltri,
M. De Muri,
M. Agostini,
V. Antoni,
C. Baltador,
P. Barbato,
M. Barbisan,
A. Barzon,
L. Baseggio,
M. Bigi,
M. Brombin,
L. Buonincontri,
V. Cervaro,
F. Degli Agostini,
E. Fagotti,
L. Franchin,
N. Ippolito,
T. V. Kulevoy,
B. Laterza,
Lorella Lotto,
Andrea Ludovici,
G. Maero,
M. Maniero,
L. Migliorato,
A. Minarello,
P. Minelli,
F. Molon,
G. Moro,
R. Pasqualotto,
Palak Jain,
T. Patton,
S. V. Petrenko,
A. Pimazzoni,
D. Ravarotto,
M. Recchia,
L. Romanato,
M. Romé,
F. Rossetto,
E. Sartori,
Maurizio Sattin,
F. Spinazzè,
F. Stivanello,
F. Taccogna,
M. Tollin,
L. Trevisan,
M. Ugoletti,
V. Variale,
M. Zanini,
B. Zaniol,
S. Zucchetti,
P. Sonato
Publication year - 2018
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5053304
Subject(s) - deflection (physics) , ion source , ion , beam (structure) , extraction (chemistry) , voltage , plasma , hydrogen , materials science , nuclear engineering , electrical engineering , optics , physics , chemistry , engineering , nuclear physics , chromatography , quantum mechanics
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