Open AccessHigh-resolution dislocation imaging and micro-structural analysis of HVPE-βGa2O3 films using monochromatic synchrotron topography
Author(s) -
Nadeemullah A. Mahadik,
Marko J. Tadjer,
P. L. Bonanno,
Karl D. Hobart,
Robert E. Stahlbush,
Travis J. Anderson,
Akito Kuramata
Publication year - 2018
Publication title -
apl materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.571
H-Index - 60
ISSN - 2166-532X
DOI - 10.1063/1.5051633
Subject(s) - materials science , full width at half maximum , dislocation , monochromatic color , optics , synchrotron , radius of curvature , burgers vector , curvature , synchrotron radiation , crystallography , optoelectronics , mean curvature , physics , geometry , chemistry , mathematics , mean curvature flow , composite material
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom