Open AccessImproving the sensitivity of scanning probe microscopy with mechanical vibrations
Author(s) -
Eylon Persky,
Naor Vardi,
Yishai Shperber,
Beena Kalisky
Publication year - 2018
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.5051620
Subject(s) - vibration , sensitivity (control systems) , noise (video) , scanning probe microscopy , materials science , acoustics , optics , microscopy , interference (communication) , physics , electronic engineering , computer science , engineering , computer vision , telecommunications , channel (broadcasting) , image (mathematics)
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