Characterisation of size distribution and positional misalignment of nanoscale islands by small-angle X-ray scattering | Zendy

Georg Heldt | Zendy; P. E. Thompson | Zendy; Rajesh V. Chopdekar | Zendy; Joachim Kohlbrecher | Zendy; Stephen Lee | Zendy; L. J. Heyderman | Zendy; Thomas Thomson | Zendy

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Characterisation of size distribution and positional misalignment of nanoscale islands by small-angle X-ray scattering

Author(s) -

Georg Heldt,

P. E. Thompson,

Rajesh V. Chopdekar,

Joachim Kohlbrecher,

Stephen Lee,

L. J. Heyderman,

Thomas Thomson

Publication year - 2019

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/1.5050882

Subject(s) - small angle x ray scattering , scattering , nanoscopic scale , materials science , nanostructure , small angle scattering , optics , condensed matter physics , nanotechnology , physics

Highly ordered arrays of nanoscale magnetic structures form the basis of artificial spin ices, uniform particles for bio-medical applications, and data storage as Bit Patterned Media. We demonstrate that small-angle X-ray scattering (SAXS) allows the size distribution and the positional alignment of highly ordered arrays to be determined with high spatial and statistical accuracy. The results obtained from the SAXS measurements are compared to an analysis of Scanning Electron Microscopy images and found to be in excellent agreement. This confirms the validity of the technique and demonstrates its potential as a fast, accurate, and statistically reliable method for characterising arrays of ordered nanostructures.Highly ordered arrays of nanoscale magnetic structures form the basis of artificial spin ices, uniform particles for bio-medical applications, and data storage as Bit Patterned Media. We demonstrate that small-angle X-ray scattering (SAXS) allows the size distribution and the positional alignment of highly ordered arrays to be determined with high spatial and statistical accuracy. The results obtained from the SAXS measurements are compared to an analysis of Scanning Electron Microscopy images and found to be in excellent agreement. This confirms the validity of the technique and demonstrates its potential as a fast, accurate, and statistically reliable method for characterising arrays of ordered nanostructures.

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