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Effect of N2/H2 plasma on GaN substrate cleaning for homoepitaxial GaN growth by radical-enhanced metalorganic chemical vapor deposition (REMOCVD)
Author(s) -
Frank Wilson Amalraj,
Arun Kumar Dhasiyan,
Yi Lu,
Naohiro Shimizu,
Osamu Oda,
Kenji Ishikawa,
Hiroki Kondo,
Makoto Sekine,
Nobuyuki Ikarashi,
Masaru Hori
Publication year - 2018
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5050819
Subject(s) - reflection high energy electron diffraction , chemical vapor deposition , materials science , gallium nitride , substrate (aquarium) , electron diffraction , transmission electron microscopy , plasma , crystal (programming language) , metalorganic vapour phase epitaxy , epitaxy , optoelectronics , analytical chemistry (journal) , diffraction , chemistry , nanotechnology , optics , layer (electronics) , oceanography , physics , quantum mechanics , chromatography , geology , computer science , programming language

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