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Complex plume stoichiometry during pulsed laser deposition of SrVO3 at low oxygen pressures
Author(s) -
Jun Wang,
Guus Rijnders,
Gertjan Koster
Publication year - 2018
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.5049792
Subject(s) - stoichiometry , plume , pulsed laser deposition , analytical chemistry (journal) , argon , partial pressure , thin film , plasma , oxygen , chemistry , deposition (geology) , materials science , nanotechnology , environmental chemistry , paleontology , physics , organic chemistry , sediment , thermodynamics , biology , quantum mechanics
To control the pulsed laser deposition synthesis, knowledge on the relationship between the plasma plume and the grown thin film is required. We show that the oxidation of species in the plasma plume still affects the SrVO3 growth even at low oxygen partial pressures. Optical emission spectroscopy measurements for the plasma plume at different growth conditions were correlated with the film properties determined by Atomic force microscopy, X-ray diffraction, and transport. At reducing oxygen pressures, the background argon pressure can affect the oxidation in the plasma plume, which in turn controls the growth kinetics, stoichiometry, and electrical properties of the films.

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