Influence of dielectric layers and thermal load on LeTID | Zendy

Clemens Winter | Zendy; Annika Zuschlag | Zendy; Daniel Skorka | Zendy; Giso Hahn | Zendy

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Influence of dielectric layers and thermal load on LeTID

Author(s) -

Clemens Winter,

Annika Zuschlag,

Daniel Skorka,

Giso Hahn

Publication year - 2018

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.177

H-Index - 75

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.5049339

Subject(s) - passivation , materials science , degradation (telecommunications) , common emitter , dielectric , thermal , layer (electronics) , carrier lifetime , solar cell , optoelectronics , limiting , hydrogen , composite material , silicon , electronic engineering , chemistry , thermodynamics , mechanical engineering , physics , organic chemistry , engineering

Light and elevated temperature induced degradation (LeTID) is observed for multicrystalline (mc) Si passivated emitter and rear cell (PERC) solar cells, strongly limiting solar cell parameters under operation conditions. In this contribution, we investigate the effect of surface passivation layer being present during the firing step based on lifetime samples. The LeTID effect is only observed if the surface passivation layer is present during the firing step. Samples without firing step show no LeTID. A re-passivation of the surface significantly changes the LeTID effect, showing that the whole sample treatment, temperature load and hydrogen content of a sample has to be taken into account investigating and evaluating LeTID.Light and elevated temperature induced degradation (LeTID) is observed for multicrystalline (mc) Si passivated emitter and rear cell (PERC) solar cells, strongly limiting solar cell parameters under operation conditions. In this contribution, we investigate the effect of surface passivation layer being present during the firing step based on lifetime samples. The LeTID effect is only observed if the surface passivation layer is present during the firing step. Samples without firing step show no LeTID. A re-passivation of the surface significantly changes the LeTID effect, showing that the whole sample treatment, temperature load and hydrogen content of a sample has to be taken into account investigating and evaluating LeTID.

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