Investigation of temperature and illumination dependencies of carrier-induced degradation in p-type multi-crystalline silicon | Zendy

Shaoyang Liu | Zendy; Catherine Chan | Zendy; Daniel Chen | Zendy; Moonyong Kim | Zendy; Chandany Sen | Zendy; Utkarshaa Varshney | Zendy; Brett Hallam | Zendy; Malcolm Abbott | Zendy; Stuart Wenham | Zendy; D.N. Payne | Zendy

Open Access

Investigation of temperature and illumination dependencies of carrier-induced degradation in p-type multi-crystalline silicon

Author(s) -

Shaoyang Liu,

Catherine Chan,

Daniel Chen,

Moonyong Kim,

Chandany Sen,

Utkarshaa Varshney,

Brett Hallam,

Malcolm Abbott,

Stuart Wenham,

D.N. Payne

Publication year - 2018

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.177

H-Index - 75

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.5049333

Subject(s) - degradation (telecommunications) , arrhenius plot , wafer , silicon , materials science , carrier lifetime , crystalline silicon , arrhenius equation , atmospheric temperature range , intensity (physics) , optoelectronics , light intensity , activation energy , analytical chemistry (journal) , chemistry , optics , electronic engineering , thermodynamics , physics , chromatography , engineering

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