Open AccessAbout the relevance of defect features in as-cut multicrystalline silicon wafers on solar cell performance
Author(s) -
Aditya Kovvali,
Matthias Demant,
Theresa Trötschler,
Jonas Haunschild,
Stefan Rein
Publication year - 2018
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5049330
Subject(s) - wafer , materials science , common emitter , open circuit voltage , silicon , voltage , solar cell , optoelectronics , computer science , carrier lifetime , electronic engineering , short circuit , artificial intelligence , electrical engineering , engineering
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