Open AccessEnergy yield considerations based on the BO-related defect
Author(s) -
M. Müller,
Michael Ehrl,
Johannes Heitmann
Publication year - 2018
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5049307
Subject(s) - passivation , wafer , degradation (telecommunications) , yield (engineering) , materials science , solar cell , carrier lifetime , activation energy , silicon , photovoltaic system , environmental science , optoelectronics , chemistry , electronic engineering , electrical engineering , composite material , engineering , layer (electronics)
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