Effect of laser parameters and post-texturing treatments on the optical and electrical properties of laser textured c-Si wafers
Author(s) -
Behrad Radfar,
Fırat Es,
Hisham Nasser,
Ozan Akdemir,
Alpan Bek,
Raşit Turan
Publication year - 2018
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5049298
Subject(s) - materials science , wafer , laser , silicon , crystalline silicon , optics , optoelectronics , texture (cosmology) , scanning electron microscope , laser scanning , reflection (computer programming) , isotropy , composite material , computer science , physics , artificial intelligence , image (mathematics) , programming language
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