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Resistor network modeling of microscopic transfer length measurements at bilayer systems for heterojunction solar cells
Author(s) -
Mehran Habibi,
Kai Kaufmann,
Volker Naumann,
Christian Hagendorf
Publication year - 2018
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5049248
Subject(s) - materials science , electrical resistivity and conductivity , resistor , stack (abstract data type) , wafer , optoelectronics , bilayer , heterojunction , substrate (aquarium) , electrical engineering , computer science , voltage , chemistry , engineering , biochemistry , oceanography , membrane , geology , programming language

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