Interfacial characteristics of Au/Al2O3/InP metal-insulator-semiconductor diodes
Author(s) -
Hogyoung Kim,
Yong Kim,
Byung Joon Choi
Publication year - 2018
Publication title -
aip advances
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5047538
Subject(s) - x ray photoelectron spectroscopy , atomic layer deposition , materials science , schottky barrier , schottky diode , layer (electronics) , diode , analytical chemistry (journal) , oxide , metal , thin film , deposition (geology) , semiconductor , insulator (electricity) , optoelectronics , nanotechnology , chemical engineering , chemistry , metallurgy , chromatography , paleontology , sediment , biology , engineering
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