Open AccessApplication of MIS-CELIV technique to measure hole mobility of hole-transport material for organic light-emitting diodes
Author(s) -
Chiho Katagiri,
Tsukasa Yoshida,
Matthew S. White,
Cigdem Yumusak,
Niyazi Serdar Sariçiftçi,
Kenichi Nakayama
Publication year - 2018
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5045711
Subject(s) - materials science , diode , oled , optoelectronics , insulator (electricity) , organic semiconductor , semiconductor , electron mobility , voltage , dielectric , space charge , nanotechnology , physics , electron , layer (electronics) , quantum mechanics
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