Open AccessGrowth and characterization of detector-grade CdMnTe by the vertical Bridgman technique
Author(s) -
Utpal Roy,
Oghaghare K. Okobiah,
G. S. Camarda,
Y. Cui,
R. Gul,
A. Hossain,
Ge Yang,
Stephen U. Egarievwe,
R. B. James
Publication year - 2018
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5040362
Subject(s) - ingot , materials science , electrical resistivity and conductivity , diffraction , crystal growth , detector , electron , ohm , analytical chemistry (journal) , optics , crystallography , chemistry , physics , metallurgy , nuclear physics , alloy , chromatography , quantum mechanics
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom