Open AccessComparison of image properties in full-field phase X-ray microscopes based on grating interferometry and Zernike's phase contrast optics
Author(s) -
Hidekazu Takano,
Yanlin Wu,
Jeff Irwin,
Stan Maderych,
Marty Leibowitz,
Andrei Tkachuk,
Arjun Kumar,
Benjamin Hornberger,
Atsushi Momose
Publication year - 2018
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.5039676
Subject(s) - optics , zernike polynomials , grating , interferometry , microscope , phase (matter) , materials science , phase contrast imaging , physics , phase contrast microscopy , quantum mechanics , wavefront
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