Open AccessMeasuring femtometer lattice displacements driven by free carrier diffusion in a polycrystalline semiconductor using time-resolved x-ray scattering
Author(s) -
Wonhyuk Jo,
Eric C. Landahl,
Anthony D. DiChiara,
Donald A. Walko,
Sooheyong Lee
Publication year - 2018
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.5039582
Subject(s) - scattering , materials science , crystallite , charge carrier , indium antimonide , semiconductor , molecular physics , condensed matter physics , optics , optoelectronics , chemistry , physics , metallurgy
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