Open AccessDiscussion on impact of load rate on distribution network reliability
Author(s) -
Ke Wang
Publication year - 2018
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5039005
Subject(s) - failure rate , reliability (semiconductor) , reliability engineering , component (thermodynamics) , monte carlo method , computer science , engineering , statistics , mathematics , power (physics) , physics , quantum mechanics , thermodynamics
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