Open AccessInfluence of inverter DC voltage on the reliability of IGBT
Author(s) -
Youzhong Miao,
Weimin Lei,
Shunxin Li,
Xin Lv,
Bo Li,
Pengzhan Wang,
Jianzhong Xu,
Huawei Li
Publication year - 2018
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5038995
Subject(s) - insulated gate bipolar transistor , reliability (semiconductor) , inverter , voltage , power (physics) , electrical engineering , power semiconductor device , computer science , electronic engineering , reliability engineering , engineering , physics , quantum mechanics
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