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Metrological large range magnetic force microscopy
Author(s) -
Gaoliang Dai,
Xiukun Hu,
S. Sievers,
Alexander Fernández Scarioni,
V. Neu,
Jens Fluegge,
H. W. Schumacher
Publication year - 2018
Publication title -
review of scientific instruments
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.5035175
Subject(s) - metrology , magnetic force microscope , microscopy , range (aeronautics) , materials science , optics , magnetic field , physics , magnetization , composite material , quantum mechanics

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