Open AccessCombined I(V) and dI(V)/dz scanning tunneling spectroscopy
Author(s) -
Carolien Castenmiller,
Rik van Bremen,
Kai Sotthewes,
Martin Herman Siekman,
Harold J. W. Zandvliet
Publication year - 2018
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5034422
Subject(s) - scanning tunneling microscope , scanning tunneling spectroscopy , scanning probe microscopy , biasing , spin polarized scanning tunneling microscopy , electrochemical scanning tunneling microscope , quantum tunnelling , substrate (aquarium) , materials science , analytical chemistry (journal) , non contact atomic force microscopy , signal (programming language) , physics , spectroscopy , conductive atomic force microscopy , optoelectronics , voltage , atomic force microscopy , chemistry , nanotechnology , oceanography , chromatography , quantum mechanics , geology , computer science , programming language
We present a method to simultaneously record I(V) and dI(V)dz spectra in a scanning tunneling microscopy measurement, where I, V and z refer to the tunnel current, sample bias and tip-substrate separation, respectively. The I(V) spectrum is recorded by ramping the bias voltage, while the feedback loop of the scanning tunneling microscope is disabled. Simultaneously the z-piezo is modulated with a small sinusoidal high frequency signal. The dI(V)dz signal is recorded using a lock-in amplifier. This method allows to simultaneously record the topography, I(V), dI(V)dV and dI(V)dz in a single scanning tunneling microscopy measurement.
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