Interactions between silver inner electrode and Fe-Si-Cr alloy of metal multilayer chip inductors
Author(s) -
Yung-Ping Wu,
Hsin-Yun Chiang,
HsingI Hsiang
Publication year - 2018
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5032300
Subject(s) - materials science , alloy , diffractometer , electrode , scanning electron microscope , oxide , passivation , transmission electron microscopy , silicon , analytical chemistry (journal) , optoelectronics , metallurgy , layer (electronics) , composite material , nanotechnology , chemistry , chromatography
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom