Open AccessPositive and negative variations in capacitive images for given defects under varying experimental conditions
Author(s) -
Chen Li,
Xiaokang Yin,
Zhen Li,
Wei Li,
Guoming Chen
Publication year - 2018
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5031661
Subject(s) - capacitive sensing , parametric statistics , finite element method , electromagnetic field , materials science , sensitivity (control systems) , acoustics , electrode , electronic engineering , structural engineering , engineering , mathematics , electrical engineering , physics , statistics , quantum mechanics
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