Open AccessDefect recognition in CFRP components using various NDT methods within a smart manufacturing process
Author(s) -
David Schumacher,
Norbert Meyendorf,
Issa Hakim,
Uwe Ewert
Publication year - 2018
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5031521
Subject(s) - nondestructive testing , process (computing) , reliability (semiconductor) , thermography , computer science , manufacturing process , materials science , reliability engineering , engineering , composite material , medicine , physics , radiology , operating system , power (physics) , quantum mechanics , infrared , optics
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