A new fit to secondary emission yield in the low impact voltage regime: An improvement of Vaughan’s expression | Zendy

Jonathan Ludwick | Zendy; G. Tripathi | Zendy; M. Cahay | Zendy; Steven B. Fairchild | Zendy; P. T. Murray | Zendy; Tyson C. Back | Zendy

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A new fit to secondary emission yield in the low impact voltage regime: An improvement of Vaughan’s expression

Author(s) -

Jonathan Ludwick,

G. Tripathi,

M. Cahay,

Steven B. Fairchild,

P. T. Murray,

Tyson C. Back

Publication year - 2018

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.5031006

Subject(s) - secondary emission , yield (engineering) , expression (computer science) , secondary electrons , voltage , electron , physics , computational physics , atomic physics , nuclear physics , computer science , quantum mechanics , thermodynamics , programming language

Reducing the emission of secondary electrons from materials is critical to improved efficiency and increased performance in high power vacuum electronics. A new mathematical expression for the secondary emission yield (SEY) as a function of the impact voltage up to a maximum of 5 kilovolts is proposed which is an extension of a formula first suggested by Vaughan. The new analytical fit and Vaughan’s fit are compared with SEY experimental data reported by others and measured by our group. The new analytical expression gives good fits to SEY experimental data in all cases, even when the SEY maximum is either slightly larger or below unity, two situations for which Vaughan’s fit is either inadequate or inapplicable.Reducing the emission of secondary electrons from materials is critical to improved efficiency and increased performance in high power vacuum electronics. A new mathematical expression for the secondary emission yield (SEY) as a function of the impact voltage up to a maximum of 5 kilovolts is proposed which is an extension of a formula first suggested by Vaughan. The new analytical fit and Vaughan’s fit are compared with SEY experimental data reported by others and measured by our group. The new analytical expression gives good fits to SEY experimental data in all cases, even when the SEY maximum is either slightly larger or below unity, two situations for which Vaughan’s fit is either inadequate or inapplicable.

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