English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

Reducing the emission of secondary electrons from materials is critical to improved efficiency and increased performance in high power vacuum electronics. A new mathematical expression for the secondary emission yield (SEY) as a function of the impact voltage up to a maximum of 5 kilovolts is proposed which is an extension of a formula first suggested by Vaughan. The new analytical fit and Vaughan’s fit are compared with SEY experimental data reported by others and measured by our group. The new analytical expression gives good fits to SEY experimental data in all cases, even when the SEY maximum is either slightly larger or below unity, two situations for which Vaughan’s fit is either inadequate or inapplicable.Reducing the emission of secondary electrons from materials is critical to improved efficiency and increased performance in high power vacuum electronics. A new mathematical expression for the secondary emission yield (SEY) as a function of the impact voltage up to a maximum of 5 kilovolts is proposed which is an extension of a formula first suggested by Vaughan. The new analytical fit and Vaughan’s fit are compared with SEY experimental data reported by others and measured by our group. The new analytical expression gives good fits to SEY experimental data in all cases, even when the SEY maximum is either slightly larger or below unity, two situations for which Vaughan’s fit is either inadequate or inapplicable.

A new fit to secondary emission yield in the low impact voltage regime: An improvement of Vaughan’s expression