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Oxidation mechanism of thin Cu films: A gateway towards the formation of single oxide phase
Author(s) -
Sumita Choudhary,
J. V. N. Sarma,
Surojit Pande,
Soraya AbabouGirard,
Pascal Turban,
Bruno Lépine,
S. Gangopadhyay
Publication year - 2018
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5028407
Subject(s) - oxide , thermal oxidation , thin film , copper oxide , analytical chemistry (journal) , materials science , x ray photoelectron spectroscopy , raman spectroscopy , partial pressure , phase (matter) , copper , oxygen , chemistry , chemical engineering , nanotechnology , metallurgy , optics , physics , organic chemistry , chromatography , engineering

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