Open AccessComposite degradation model and corresponding failure mechanism for mid-power GaN-based white LEDs
Author(s) -
Haicheng Cao,
Zhanhong Ma,
Baojuan Sun,
Xuejiao Sun,
Chao Yang,
Xiaodong Li,
Junxi Wang,
Lixia Zhao
Publication year - 2018
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5027783
Subject(s) - luminous flux , chromaticity , light emitting diode , degradation (telecommunications) , materials science , luminous efficacy , composite number , phosphor , flux (metallurgy) , accelerated aging , optoelectronics , stress (linguistics) , composite material , optics , computer science , layer (electronics) , physics , metallurgy , telecommunications , light source , linguistics , philosophy
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