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Study on silicon crystallization with aluminum deposition temperature in the aluminum-induced crystallization process using silicon oxide
Author(s) -
Doo Won Lee,
Muhammad Fahad Bhopal,
Soo Hong Lee
Publication year - 2018
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5026990
Subject(s) - materials science , crystallization , silicon , grain size , aluminium , deposition (geology) , surface roughness , metallurgy , layer (electronics) , scanning electron microscope , silicon oxide , composite material , chemical engineering , silicon nitride , paleontology , sediment , engineering , biology

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