Open AccessThe microstructural changes of Ge2Sb2Te5 thin film during crystallization process
Author(s) -
Jingbo Xu,
Chao Qi,
Limin Chen,
Long Zheng,
Qiyun Xie
Publication year - 2018
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5025204
Subject(s) - materials science , crystallization , annealing (glass) , amorphous solid , raman spectroscopy , metastability , phase change memory , thin film , surface roughness , recrystallization (geology) , surface finish , grain size , crystallography , chemical engineering , optoelectronics , composite material , optics , nanotechnology , layer (electronics) , chemistry , paleontology , physics , organic chemistry , engineering , biology
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