Probing molecular orientations in thin films by x-ray photoelectron spectroscopy
Author(s) -
Y. Li,
P. Li,
ZhengHong Lu
Publication year - 2018
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5025175
Subject(s) - x ray photoelectron spectroscopy , thin film , materials science , spectroscopy , molecule , molecular orbital , photoemission spectroscopy , optoelectronics , analytical chemistry (journal) , nanotechnology , chemistry , nuclear magnetic resonance , physics , organic chemistry , quantum mechanics , chromatography
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