Real-time optical monitoring of semiconductor epitaxial growth
Author(s) -
A. LastrasMartínez,
J. OrtegaGallegos,
L. E. Guevara-Macías,
D. Ariza-Flores,
O. Núñez-Olvera,
R. LópezEstopier,
R. E. BalderasNavarro,
L. F. LastrasMartínez
Publication year - 2018
Publication title -
aip conference proceedings
Language(s) - Uncategorized
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5024495
Subject(s) - epitaxy , anisotropy , molecular beam epitaxy , reflectivity , materials science , semiconductor , optoelectronics , spectroscopy , optics , nanotechnology , physics , layer (electronics) , quantum mechanics
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