Open AccessErratum: “Mechanism and application method to analyze the carrier scattering factor by electrical conductivity ratio based on thermoelectric property measurement” [J. Appl. Phys. 123, 015101 (2018)]
Author(s) -
Guiying Xu,
Pan Ren,
Tie Lin,
Xiaofeng Wu,
Yanhua Zhang,
Si-Tong Niu,
Trevor P. Bailey
Publication year - 2018
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5022592
Subject(s) - thermoelectric effect , electrical resistivity and conductivity , scattering , property (philosophy) , materials science , mechanism (biology) , condensed matter physics , thermoelectric materials , conductivity , carrier scattering , physics , optoelectronics , thermodynamics , optics , quantum mechanics , philosophy , epistemology
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom