Open AccessErratum: “Spectroscopic ellipsometry-based study of optical properties of amorphous and crystalline ZnSnO alloys and Zn2SnO4 thin films grown using sputtering deposition: Dielectric function and subgap states” [J. Appl. Phys. 119, 135302 (2016)]
Author(s) -
Kun Hee Ko,
Hyeon Seob So,
Dae Ho Jung,
Jun Woo Park,
Hosun Lee
Publication year - 2018
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5022103
Subject(s) - dielectric function , amorphous solid , materials science , ellipsometry , sputtering , thin film , dielectric , deposition (geology) , condensed matter physics , sputter deposition , optoelectronics , nanotechnology , crystallography , physics , chemistry , paleontology , sediment , biology
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