Improvement of adhesion of hydrogen-free DLC film by employing an interlayer of tungsten carbide
Author(s) -
Ryo Isono,
Tsuyoshi Tanimoto,
Yushi Iijima,
Sholihatta Aziz Kusumawan,
Toru Harigai,
Yoshiyuki Suda,
Hirofumi Takikawa,
Masao Kamiya,
Satoru Kaneko,
Shinsuke Kunitsugu,
Makoto Taki
Publication year - 2018
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5021932
Subject(s) - materials science , tungsten carbide , diamond like carbon , layer (electronics) , adhesion , tungsten , cathode , composite material , carbide , carbon film , substrate (aquarium) , carbon fibers , thin film , nanotechnology , metallurgy , composite number , chemistry , oceanography , geology
Materials with poor adhesion present a problem for the application of diamond-like carbon (DLC) films. As a method for solving this problem, there is a technique that deposits an interlayer of metal between the DLC film and substrate. A tungsten carbide film (W-C film) is used as the interlayer. In this study, the effect of introducing the W-C interlayer on the adhesion of the DLC film was investigated. The W-C films were deposited using two types of cemented tungsten carbides (WCs) as the cathode, one containing Co (WC-Co) and the other containing Ti (WC-Ti), as a binder for forming the cathode shape. It is necessary to control the film thickness of the interlayer to introduce the interlayer to the DLC film. The film thickness control of W-C films became possible by using a discharge counter. DLC films were deposited using a bias voltage of -100 V. The film thicknesses of the W-C interlayer and DLC film at the time of investigating adhesion were 30 nm and 300 nm, respectively. The result of the tape-peel...
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