Structural analysis of LaVO3 thin films under epitaxial strain
Author(s) -
Hugo Meley,
Karandeep,
L. Oberson,
Joeri de Bruijckere,
Duncan T. L. Alexander,
JeanMarc Triscone,
Philippe Ghosez,
Stefano Gariglio
Publication year - 2018
Publication title -
apl materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.571
H-Index - 60
ISSN - 2166-532X
DOI - 10.1063/1.5021844
Subject(s) - materials science , condensed matter physics , epitaxy , crystallography , perovskite (structure) , thin film , octahedron , transmission electron microscopy , ab initio , ab initio quantum chemistry methods , crystal structure , nanotechnology , layer (electronics) , chemistry , physics , organic chemistry , molecule
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