Open AccessTransient pulse analysis of ionized electronics exposed to γ-radiation generated from a relativistic electron beam
Author(s) -
Sunhong Min,
Ohjoon Kwon,
Matlabjon Sattorov,
InKeun Baek,
Seontae Kim,
Dongpyo Hong,
Jin Young Jeong,
Jeongmin Jang,
Anirban Bera,
R. K. Barik,
Ranajoy Bhattacharya,
Ilsung Cho,
Byungsu Kim,
Chawon Park,
WonGyun Jung,
Kyoung Sun Park,
GunSik Park
Publication year - 2018
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.5018727
Subject(s) - relativistic electron beam , physics , electron , beam (structure) , optics , photocurrent , pulse (music) , semiconductor device , cathode ray , optoelectronics , atomic physics , materials science , nuclear physics , nanotechnology , detector , layer (electronics)
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