Open AccessSmall sample estimation of the reliability function for technical products
Author(s) -
L. L. Lyamets,
I. V. Yakimenko,
О. А. Канищев,
Olga Bliznyuk
Publication year - 2017
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5017384
Subject(s) - statistic , reliability (semiconductor) , method of moments (probability theory) , sample (material) , computer science , function (biology) , estimation , reliability engineering , moment (physics) , test statistic , statistics , algorithm , mathematics , statistical hypothesis testing , engineering , power (physics) , physics , chemistry , systems engineering , chromatography , quantum mechanics , classical mechanics , estimator , evolutionary biology , biology
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