Open AccessGamma non-ionizing energy loss: Comparison with the damage factor in silicon devices
Author(s) -
E. El Allam,
C. Inguimbert,
A. Meulenberg,
Anouar Jorio,
Izeddine Zorkani
Publication year - 2018
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.5013211
Subject(s) - ionizing radiation , silicon , radiation damage , fluence , materials science , scaling , gamma ray , radiation , irradiation , atomic physics , optoelectronics , physics , nuclear physics , geometry , mathematics
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