Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7−δ thin films | Zendy

Nicolas Gauquelin | Zendy; Hao Zhang | Zendy; Guozhen Zhu | Zendy; J. Y. T. Wei | Zendy; Gianluigi A. Botton | Zendy

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Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7−δ thin films

Author(s) -

Nicolas Gauquelin,

Hao Zhang,

Guozhen Zhu,

J. Y. T. Wei,

Gianluigi A. Botton

Publication year - 2018

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.5011761

Subject(s) - overlayer , scanning transmission electron microscopy , materials science , thin film , planar , electron energy loss spectroscopy , transmission electron microscopy , stoichiometry , pulsed laser deposition , superconductivity , high temperature superconductivity , condensed matter physics , epitaxy , layer (electronics) , chemistry , nanotechnology , computer science , physics , computer graphics (images) , organic chemistry

We have discovered two novel types of planar defects that appear in heteroepitaxial YBa2Cu3O7−δ (YBCO123) thin films, grown by pulsed-laser deposition (PLD) either with or without a La2/3Ca1/3MnO3 (LCMO) overlayer, using the combination of high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) imaging and electron energy loss spectroscopy (EELS) mapping for unambiguous identification. These planar lattice defects are based on the intergrowth of either a BaO plane between two CuO chains or multiple Y-O layers between two CuO2 planes, resulting in non-stoichiometric layer sequences that could directly impact the high-Tc superconductivity.

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