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Stabilizing ultra-thin black phosphorus with in-situ-grown 1 nm-Al2O3 barrier
Author(s) -
Regina Galceran,
Étienne Gaufrès,
Annick Loiseau,
Maëlis Piquemal-Banci,
Florian Godel,
Aymeric Vecchiola,
Odile Bezencenet,
M.-B. Martin,
Bernard Servet,
F. Pétroff,
Bruno Dlubak,
Pierre Sénéor
Publication year - 2017
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.5008484
Subject(s) - passivation , black phosphorus , raman spectroscopy , materials science , layer (electronics) , degradation (telecommunications) , optoelectronics , phosphorus , dielectric , semiconductor , nanotechnology , chemical engineering , optics , electronic engineering , metallurgy , physics , engineering

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