z-logo
open-access-imgOpen Access
A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution
Author(s) -
U. Zastrau,
Christian Rödel,
M. Nakatsutsumi,
Torsten Feigl,
Karen Appel,
B. Chen,
T. Döppner,
Thomas Fennel,
Tobias Fiedler,
L. B. Fletcher,
E. Förster,
E. J. Gamboa,
D. O. Gericke,
S. Göde,
C. Grote-Fortmann,
Vinzenz Hilbert,
Lev Kazak,
Tim Laarmann,
Hae Ja Lee,
P. Mabey,
Franklin Martinez,
K.H. MeiwesBroer,
Hagen Pauer,
Marco Perske,
Andreas Przystawik,
Sebastian Roling,
Sławomir Skruszewicz,
Mohammed Shihab,
J. Tiggesbäumker,
S. Toleikis,
Martin Wünsche,
H. Zacharias,
S. H. Glenzer,
G. Gregori
Publication year - 2018
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.5007950
Subject(s) - extreme ultraviolet lithography , optics , materials science , extreme ultraviolet , micrometer , laser , microscope , plasma , resolution (logic) , physics , quantum mechanics , artificial intelligence , computer science

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom