Co-based amorphous thin films on silicon with soft magnetic properties | Zendy

Ansar Masood | Zendy; Paul McCloskey | Zendy; Cian Ó Mathúna | Zendy; Santosh Kulkarni | Zendy

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Co-based amorphous thin films on silicon with soft magnetic properties

Author(s) -

Ansar Masood,

Paul McCloskey,

Cian Ó Mathúna,

Santosh Kulkarni

Publication year - 2017

Publication title -

aip advances

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.421

H-Index - 58

ISSN - 2158-3226

DOI - 10.1063/1.5007733

Subject(s) - materials science , amorphous solid , ferromagnetic resonance , sputter deposition , thin film , magnetic hysteresis , amorphous silicon , permeability (electromagnetism) , hysteresis , nuclear magnetic resonance , silicon , ferromagnetism , sputtering , magnetostriction , condensed matter physics , optoelectronics , magnetic field , magnetization , nanotechnology , crystallography , chemistry , crystalline silicon , physics , biochemistry , quantum mechanics , membrane

The present work investigates the emergence of multiple modes in the high-frequency permeability spectrum of Co-Zr-Ta-B amorphous thin films. Amorphous thin films of different thicknesses (t=100-530 nm) were deposited by DC magnetron sputtering. Their static and dynamic soft magnetic properties were investigated to explore the presence of multi-magnetic phases in the films. A two-phase magnetic behavior of the thicker films (≥333 nm) was revealed by the in-plane hysteresis loops. Multiple resonance peaks were observed in the high-frequency permeability spectrum of the thicker films. The thickness dependent multiple resonance peaks below the main ferromagnetic resonance (FMR) can be attributed to the two-phase magnetic behaviors of the films.

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