Open AccessCalibrated work function mapping by Kelvin probe force microscopy
Author(s) -
Pablo Arturo Fernandez Garrillo,
Benjamin Grévin,
Nicolas Chevalier,
Łukasz Borowik
Publication year - 2018
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.5007619
Subject(s) - kelvin probe force microscope , highly oriented pyrolytic graphite , work function , materials science , calibration , graphite , pyrolytic carbon , work (physics) , monocrystalline silicon , semiconductor , characterization (materials science) , microscopy , volta potential , nanotechnology , optoelectronics , optics , atomic force microscopy , composite material , physics , chemistry , silicon , thermodynamics , organic chemistry , layer (electronics) , quantum mechanics , pyrolysis
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