Research of software defect prediction based on GRA-SVM
Author(s) -
Yiming Gan,
Zhang Chun-hai
Publication year - 2017
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5005318
Subject(s) - support vector machine , computer science , grey relational analysis , software , software bug , data mining , artificial intelligence , machine learning , software metric , pattern recognition (psychology) , software quality , software development , mathematics , statistics , programming language
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