Open AccessA methodology of SiP testing based on boundary scan
Author(s) -
He Qin,
Haiyang Quan,
Yifei Han,
Tianrui Zhu,
Tuo Zheng
Publication year - 2017
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5005271
Subject(s) - boundary scan , computer science , system testing , system in package , process (computing) , reliability (semiconductor) , embedded system , reliability engineering , computer hardware , automatic test equipment , boundary (topology) , black box testing , white box testing , integration testing , engineering , integrated circuit , operating system , software , software engineering , telecommunications , mathematical analysis , mathematics , chip , power (physics) , physics , testability , software construction , quantum mechanics , software system
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