z-logo
open-access-imgOpen Access
The thermal analysis study of 3D bare chip laminated packaging structure
Author(s) -
Bangze Huang,
Zhaohua Wu
Publication year - 2017
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.5005256
Subject(s) - flip chip , interconnection , materials science , thermal resistance , chip , thermal conductivity , junction temperature , composite material , thermal conduction , thermal , thermal copper pillar bump , die (integrated circuit) , electronic packaging , optoelectronics , layer (electronics) , electrical engineering , nanotechnology , computer science , thermodynamics , engineering , telecommunications , adhesive , physics

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom